Abstract
A Czochralski-grown langasite family crystals of La 3 Ga 5 SiO 14 – La 3 Ga 4 ( GaSi ) O 14 , La 3 Ga 4 [ Ga ( Si , Ge ) ] O 14 , La 3 Ga 5.5 Ta 0.5 O 14 , La 3 Ga 5.5 Nb 0.5 O 14 , and Ca 3 NbGa 3 Si 2 O 14 were studied by X-ray diffraction. Our results show that the composition of crystals may vary both axially and radially. The two solid solutions isostructural with langasite, which were identified in La 3 Ga 4 ( GaSi ) O 14 crystal studied differ in the Ga and Si occupancies on the (Ga,Si) site: Ga > Si in one solid solution, and Si > Ga in the other. The effects of the melt composition (the Ga:Si ratio, the partial substitution of Ge for Si and of M=Nb, Ta for Ga), the atmosphere (the growth in Ar or Ar+O 2 ) and heat-treatment conditions (in vacuum, in air or in oxygen) on the color (orange or colorless), the crystal composition, the structural perfection and on the polarity reversal of structure were found and explained.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
