Abstract
AbstractA round‐robin proficiency test (RR PT) on thin‐film multi‐junction (MJ) photovoltaic (PV) cells was run between 13 laboratories within the European project CHEETAH. Five encapsulated PV cells were circulated to participants for being tested at Standard Test Conditions (STC). Three cells were a‐Si/μc‐Si tandem PV devices, each of which had a different short‐circuit current ratio between the top junction and the bottom one; the remaining two cells were single‐junction PV devices made with material representative of the individual junctions in the MJ cells. The RR PT's main purpose was to assess the capability of the participating laboratories, in terms of employed facilities and procedures, to test MJ PV devices. Therefore, participants were requested to perform STC measurements of all cells according to their own procedure, which might not include external quantum efficiency measurements. The European Solar Test Installation (ESTI) of the Joint Research Centre (JRC) provided the reference calibrations against which the participants' results are compared. ESTI made also a verification of the cells performance at STC at the end of the RR PT, in order to allow a comparison between the initial stable state at which the cells were calibrated (just before circulation) and the one they had reached at the end of the RR PT. The overall results of the RR PT are here presented and discussed together with some aspects of MJ PV testing that emerged as not adequately applied or largely missing. Their full implementation is expected to improve the consistency of future results.
Highlights
For each laboratory and device, the percentage deviations in ISC, VOC, Pmax and FF from the relevant RMPT value were calculated; they are reported in one graph per device in the following subsections
The UC of the RMPT value is shown as a shaded area symmetrically drawn around the x-axis
The major aim of the robin proficiency test (RR proficiency test (PT)) was to evaluate whether the facilities and the procedures for MJ PV testing as applied by the participants were adequate or needed to be revised and improved
Summary
O., Yilmaz, O., Leidl, R., Rennhofer, M., Zamini, S., Acciarri, M., Binetti, S., Lotter, E., Bakker, K., Kroon, J., Soppe, W., Razongles, G.,. Gevorgyan3 | Tom Betts4 | Blagovest Mihaylov4 | Ralph Gottschalg4 | Alp Osman Kodolbas5 | Okan Yilmaz5 | Roman Leidl6 | Marcus Rennhofer6 | Shokufeh Zamini6 | Maurizio Acciarri7 | Simona Binetti7 | Erwin Lotter8 | Klaas Bakker9 | Jan Kroon9 | Wim Soppe9 | Guillaume Razongles10 | Lucia V. Trigo13 | Sebastian Neubert14 | Diego Pavanello1 | Harald Müllejans1 | Iver Lauermann[14]. Present address: Ralph Gottschalg, Fraunhofer Center for Silicon Photovoltaics (CSP), Halle, Germany; Faculty of Electrical Engineering, Manufacturing and Economic Engineering (EMW), Hochschule Anhalt, Köthen, Germany
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