Abstract
Conventional scanning white-light interferometers (SWLIs) cannot measure the exact shape of a thick glass plate because of the large dispersion effect. In this paper, a novel dual SWLI is proposed where the thicknesses of both an object and a compensation glass plate can be measured exactly in four-step measurements by decreasing the dispersion effect in both arms of the dual SWLI. The compensation glass plate is made of the same material as the object and has a similar thickness. The peak positions of the interference signals in the SWLI can be exactly measured using a piezoelectric transducer stage and an additional interference signal which detects the time-varying optical path difference in the SWLI. Experimental results show that the measurement error is less than 60 nm for a glass plate of thickness 1 mm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
