Abstract
ABSTRACTA dual-model method is proposed for correcting the calibration model. In the method, a primary calibration model is built using the spectra of a primary instrument and a correction model is established to describe the ratios between the predicted results from the spectra of different instruments. The prediction for the spectra of secondary instrument can be achieved by correcting the prediction of the primary model. A mathematical proof is described for the existence of the correction model, and the model is investigated using a near-infrared spectroscopic dataset of plant leaf samples measured on two instruments. The results show that a precise correction model is obtained and the model can be used to correct the predictions of the primary model. The correlation coefficients between the predicted and the reference ratios are above 0.9, and the prediction error after the correction is at the same level of the primary model.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
