Abstract

Despite the several advantages, SiC MOSFETs suffer from issues such as low current carrying capacity, device degradation, etc. In this study, we explore the applications of Artificial Intelligence algorithms in optimizing the operation of SiC MOSFETs. We introduce the different notions of learning algorithms and provide a summary on their applications. In particular, we discuss earlier applications of AI algorithms in studying the properties of SiC MOSFETs, and highlight some challenges associated with parallel operation of SiC MOSFETs.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call