Abstract
ABSTRACTThe development of pesticide resistance significantly affects the outcomes of pest control. A quantitative depiction of the effects of pesticide resistance development on integrated pest management (IPM) strategies and pest control outcomes is challenging. To address this problem, a discrete host-parasitoid model with pesticide resistance development and IPM strategies is proposed and analyzed. The threshold condition of pest eradication which reveals the relationship between the development of pest resistance and the rate of natural enemy releases is provided and analyzed, and the optimal rate for releasing natural enemies was obtained based on this threshold condition. Furthermore, in order to reduce adverse effects of the pesticide on natural enemies, the model has been extended to consider the spraying of pesticide and releases of natural enemies at different times. The effects of the dynamic complexity and different resistance development equations on the main results are also discussed.
Highlights
Integrated pest management (IPM) involves choosing appropriate tactics from a range of pest control techniques including biological, cultural and chemical methods to maintain the density of the pest population below the Economic Injury Level (EIL) [8, 41,42,43]
In order to fight pest resistance and control pests, the simple and direct method is to reduce the frequency of spraying pesticides and apply IPM [29] including chemical and biological control
As mentioned in the introduction, the important issue is how to achieve the optimal combination of chemical control and biological control when the pesticide resistance develops
Summary
Integrated pest management (IPM) involves choosing appropriate tactics from a range of pest control techniques including biological, cultural and chemical methods to maintain the density of the pest population below the Economic Injury Level (EIL) [8, 41,42,43]. Note that a discrete model with an IPM strategy was first proposed by Tang et al [35], in which a classical host-parasitoid model was employed and analyzed Both chemical control and biological control were applied at certain generations with proportional reductions in the density of the pest population and a constant release rate of natural enemies. Given that discrete host-parasitoid models can depict the dynamics of both pest and natural enemy populations, they can be useful for designing optimal strategies to fight against the evolution of pesticide resistance. The question is how do natural enemy releasing strategies affect the pest control under the development of pesticide resistance, which will be studied in the following
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