Abstract
This article demonstrates all-digital tuning and dynamic control of feedback compensator in digital low drop out regulators to enhance the transient performance under process and passive variations, aging, and load changes. The measured results from a 130-nm CMOS test-chip shows 2.1× improvement in transient performance under process variations and 30% improvement for aging-induced degradations. We demonstrate 55-ns setting time for a 5 to 45 mA load step in 100 ps, with 97.8% peak current efficiency.
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