Abstract
A different reading of the available I– V curves is proposed for laser diodes whose characteristics display some degradation. In particular, the usual monitoring of the optical power P and of the threshold current I th is complemented by the inspection of two more parameters, which separately or jointly contribute to the general variation of I th. These two parameters are related to the simplest laser model, made of an ideal diode that is voltage-clamped under operating conditions, and are completely defined by those same standard measurements that lead to evaluate I th. A different definition of the failure modes, and a deeper insight in the possible failure mechanisms are derived. Combined voltage and optical power monitoring during constant-current life-tests is also proposed as a more discriminating measurement than usually considered.
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