Abstract
We construct an instrument to study the behavior of delamination strength in laminates which can be defined as the critical transverse stress at which an actual delamination occurs. The device allows the anvil measurements at room temperature or the liquid nitrogen temperature. For the electro-magnetic laminated materials (e.g., a superconducting YaBa2Cu3O(7-x) coated conductor which has a typical laminated structure), the delamination strength was measured while the properties of transport current were also recorded. Moreover, the influences of external magnetic field on the delamination strength were presented.
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