Abstract
Samples of polycrystalline aluminum were tested in reverse bending fatigue over the temperature range from 543 to 673 K. Observations showed that a majority of the grain boundaries migrated in a regular manner during fatigue testing at low frequencies, and quantitative measurements of migration revealed a distribution of migration distances at the different boundaries. A small but consistent proportion of the boundaries exhibited no measurable migration and these boundaries constituted ~ 10% of the total boundary population. The structural nature of the migrating and non-migrating boundaries was characterized using electron channeling pattern (ECP) analysis. The results of this analysis show that the random boundaries generally migrate by large amounts whereas the non-migrating boundaries are of the coincidence type
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