Abstract
AbstractA study of the electrical losses of thin‐film modules is presented. Using the electrical circuit simulator PSpice, the influence of the distributed series resistance of the top and the bottom contact of the active area and the influence of the monolithic contact area on the module performance was revealed and demonstrated. A large impact of the distributed series resistance of transparent conducting oxide layer on the module performance was analysed. Study of the monolithic contact area shows a crucial impact of the back‐contact separation cut on the module performance. All other regions that form the monolithic contact contribute significantly to the width of the dead area region in a module. An application of the CIGS‐based study of the monolithic contact on an a‐Si/μc‐Si module is presented. Copyright © 2005 John Wiley & Sons, Ltd.
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