A Deep Learning Approach for Fault Detection and Diagnosis of Industrial Processes using Quantum Computing

Abstract

Quantum computing and deep learning methods hold great promise to open up a new era of computing and have been receiving significant attention recently. This paper presents quantum computing (QC) based deep learning methods for fault diagnosis that are capable of overcoming the computational challenges faced by conventional techniques performed on classical computers. The shortcomings of such classical data-driven techniques are addressed by the proposed QC-based fault diagnosis model. A quantum computing assisted generative training process followed by supervised discriminative training is used to train this model. The applicability of proposed model and methods is demonstrated by applying them to process monitoring of Tennessee Eastman (TE) process. The proposed QC-based deep learning approach enjoys superior performance with an average fault diagnosis rate of 80% and tremendously low false alarm rates for the TE process.