Abstract
In order to realize BIST (Built-In Self-Test) of mixed circuits, the D-M chaos ATPG (Auto Test Pattern Generator) method is proposed in this paper. The features of time series generated by D-M chaos model are analyzed to prove that it can be used in ATPG. The ATPG is a wide spectrum of signal sequences, and its correlation is small and close to the white noise, so it can be used in digital circuits BIST. Furthermore, in order to make it can be used in the test of analog circuits, the chaotic time series is reconstructed. FPGA is used as BIST controller of digital-analog mixed circuits test system to validate this method. The experimental results show that the proposed method can effectively identify the fault in mixed-signal circuits, and it can be used in mixed circuits BIST as a general method.
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