Abstract
This paper proposes a novel method to characterize the jitter of waveform recorders by measuring the power spectral density (PSD) of the jitter components due to the phase noise of the sampling clock and the aperture delay in the sampling circuit. The method relies on a simple sinewave test, where the phase information is extracted from the acquired signal; however, the effects of the quantization and additive noise are minimized by exploiting the cyclostationary properties of the acquired sequence. The results in simulations and on digital storage oscilloscopes show the capability of the method of accurately measuring the PSDs of the considered components.
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