Abstract
Purpose – Stochastic uncertainties in material parameters have a significant impact on the analysis of real-world electromagnetic compatibility (EMC) problems. Conventional approaches via the Monte-Carlo scheme attempt to provide viable solutions, yet at the expense of prohibitively elongated simulations and system overhead, due to the large amount of statistical implementations. The purpose of this paper is to introduce a 3-D stochastic finite-difference time-domain (S-FDTD) technique for the accurate modelling of generalised EMC applications with highly random media properties, while concurrently offering fast and economical single-run realisations. Design/methodology/approach – The proposed method establishes the concept of covariant/contravariant metrics for robust tessellations of arbitrarily curved structures and derives the mean value and standard deviation of the generated fields in a single-run. Also, the critical case of geometrical and physical uncertainties is handled via an optimal parameteri...
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