Abstract
In recent gears, the IEEE 1057-93 Standard (1994) for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the standard to be insensitive to ADC hysteresis. In this paper, an alternative test procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the large amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure, and noise-sensitivity analysis are presented and discussed.
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