Abstract
Thermal stress in multilayer thin films during a heating or freezing process can be employed to form different morphologies: wrinkles, buckles, and cracks. In this paper, a simple process based on above method is explored to induce nano-crack, which could be used as an excellent electron tunneling channel for surface conduction electron-emitter (SCE). The crack position is uplift by the buckling and delaminating process, and the crack size is controlled by the freezing temperature. Compared with the conventional two-dimensional SCE, the crater shape SCE constrained the electron trajectory, which led higher emission current and lower turn-on voltage.
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