Abstract
In this paper, the reliability of capacitive shunt RF MEMS switches have been investigated using three dimensional (3D) coupled multiphysics finite element (FE) analysis. The coupled field analysis involved three consecutive multiphysics interactions. The first interaction is characterized as a two-way sequential electromagnetic (EM)-thermal field coupling. The second interaction represented a one-way sequential thermal-structural field coupling. The third interaction portrayed a two-way sequential structural-electrostatic field coupling. An automated substructuring algorithm was utilized to reduce the computational cost of the complicated coupled multiphysics FE analysis. The results of the substructured FE model with coupled field analysis is shown to be in good agreement with the outcome of previously published experimental and numerical studies. The current numerical results indicate that the pull-in voltage and the buckling temperature of the RF switch are functions of the microfabrication residual stress state, the switch operational frequency and the surrounding packaging temperature. Furthermore, the current results point out that by introducing proper mechanical approaches such as corrugated switches and through-holes in the switch membrane, it is possible to achieve reliable pull-in voltages, at various operating temperatures. The performed analysis also shows that by controlling the mean and gradient residual stresses, generated during microfabrication, in conjunction with the proposed mechanical approaches, the power handling capability of RF MEMS switches can be increased, at a wide range of operational frequencies. These design features of RF MEMS switches are of particular importance in applications where a high RF power (frequencies above 10 GHz) and large temperature variations are expected, such as in satellites and airplane condition monitoring.
Highlights
Radio Frequency (RF) Micro-Electro-Mechanical Systems (MEMS) capacitive shunt switches have had an enormous impact on the applications of wireless communication systems and satellite technology
RF MEMS switches is examined
The commercialization of RF MEMS switches is subject to the elimination of the buckling failure at high RF power and the stiction problem associated with higher actuation voltages
Summary
Radio Frequency (RF) Micro-Electro-Mechanical Systems (MEMS) capacitive shunt switches have had an enormous impact on the applications of wireless communication systems and satellite technology. Depending upon the magnitude and direction of the residual stresses, this localized heating could potentially cause the RF MEMS switch to fail under severe buckling with sufficient load. The actuation voltage of RF MEMS switches is affected by the geometry of these switches; for example, a mechanically stiffer switch will require a larger pull-in voltage. A multi-domain 3D FE model is developed to investigate the multiphysics interactions within capacitive shunt RF MEMS switches This coupled field model studies the electromagnetic, thermal, structural and electrostatic physics of RF MEMS switches, in response to variations within geometry, residual stresses (mean and gradient) and operational current frequency. The obtained results are utilized to predict the onset of stiction and buckling with RF MEMS switches and its effect on these switches long term reliability
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