Abstract

ABSTRACTMetrology data are crucial to quality control of three-dimensional (3D) printed parts. Low-cost measurement systems are often unreliable due to their low resolutions, whereas high-resolution measurement systems usually induce high measurement costs. To balance the measurement cost and accuracy, a new cost-effective and reliable measurement strategy is proposed in this article, which jointly uses two-resolution measurement systems. Specifically, only a small sample of base parts are measured by both the low- and high-resolution measurement systems in order to save costs. The measurement accuracy of most parts with only low-resolution metrology data is improved by effectively integrating high-resolution metrology data of the base parts. A Bayesian generative model parameterizes a part-independent bias and variance pattern of the low-resolution metrology data and facilitates a between-part data integration via an efficient Markov chain Monte Carlo sampling algorithm. This multi-part two-resolution metrology data integration highlights the novelty and contribution of this article compared with the existing one-part data integration methods in the literature. Finally, an intensive experimental study involving a laser scanner and a machine visual system has validated the effectiveness of our measurement strategy in acquisition of reliable metrology data of 3D printed parts.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call