Abstract

Thin films of La 0.67Ba 0.33MnO 3 were deposited on NdGaO 3 by pulsed laser deposition with in situ RHEED diagnostics. A strong dependence of structural and electrical transport properties of the films on the background oxygen pressure was observed. Electrical resistance versus temperature and X-ray diffraction measurements were used to characterise the deposited films. Deposition at low background oxygen pressure (≈10 −1 Pa) resulted in a good structural quality with an atomically flat surface, but poorer transport properties compared to films grown at higher pressure (≈50 Pa). These observations have been correlated with the characteristics of the plume expansion by studying pulsed laser ablation of manganate samples into oxygen background gas by optical emission spectroscopy and ion probe diagnostics. These studies have been carried out using the parent LaMnO 3 compound as target material in presence of an oxidizing atmosphere.

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