Abstract
Fully digital impedance bridges are emerging as measuring instruments for primary electrical impedance metrology and the realization of impedance units and scales. This article presents a comprehensive analysis of electronic fully digital impedance bridges for both generating (based on digital-to-analog converters) and digitizing (based on analog-to-digital converters) bridges. The sources of measurement error are analyzed in detail and expressed by explicit mathematical formulas ready to be applied to the specific bridge and measurement case of interest. The same can be employed also as a basis to optimize the design and the operating parameters of digital bridges and evaluate the measurement uncertainty. A practical application of the analysis to the digital bridges developed and measurements performed in the framework of an international research project is presented.
Highlights
I MPEDANCE bridges compare an impedance ratio to a reference ratio.Manuscript received August 27, 2020; revised October 12, 2020; accepted October 16, 2020
This work has been realized within the Joint Research Project 17RPT04 VersICaL: A versatile impedance calibration laboratory based on digital impedance bridges
We present here a comprehensive analysis of the error sources in electronic fully digital bridges for generating (Sections II and III) and digitizing bridges (Sections IV and V)
Summary
I MPEDANCE bridges compare an impedance ratio to a reference ratio (see [1] for a comprehensive review). This work has been realized within the Joint Research Project 17RPT04 VersICaL: A versatile impedance calibration laboratory based on digital impedance bridges. With typical accuracies in the 10−6–10−5 range, these kinds of bridges are not as accurate as traditional transformer-ratio bridges [10], [12], [13] or Josephson bridges [14]–[17] but can measure impedances across the whole complex plane and are characterized by affordable cost, short measuring time, and ease of operation These features make them suitable for smaller national metrology institutes and calibration laboratories. For the analysis of these error sources, see [21]
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