Abstract
A semiconductor thermal-damage model was presented previously. Accuracy verification was limited to dc pulses and a damped sinusoidal waveform. Data published on UHF transistors allow additional model verification to RF pulses. 1 Results confirm that dc-pulse data are sufficient to predict RF-pulse damage levels.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: IEEE Transactions on Electromagnetic Compatibility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.