Abstract
We examine proton-damaged charge-coupled devices (CCDs) and compare the charge transfer efficiency (CTE) degradation using extended pixel edge response, first pixel response, and /sup 55/Fe X-ray measurements. CTEs measured on Marconi and Fairchild imaging sensors CCDs degrade similarly at all signal levels, though some of the Fairchild CCDs had a supplementary buried channel.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
More From: IEEE Transactions on Nuclear Science
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
