Abstract
The speciation and morphology of U carbide inclusions in pre- and post-melt U metal have been explored using high-resolution analytical electron microscopy (AEM). This report presents Part 2 of our study, in which aberration (Cs) corrected transmission and scanning transmission electron microscopies (S/TEM) were used to elementally and crystallographically characterize C-containing impurities and defect features in U samples for comparison with results obtained by scanning electron microscopy (SEM) in Part 1, previously published by this journal. Elemental mapping and unit cell matching of inclusions by S/TEM are consistent with phases observed by SEM, and new dislocations can be observed associating with some inclusion morphologies but not others.
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