Abstract
The influence of a submerged baffle on single crystal growth of germanium–silicon is investigated. Twelve crystals have been grown. Eight of them have been grown using the axial heat processing (AHP) technique which makes use of a baffle submerged into the melt. The other crystals have been grown using the conventional vertical Bridgman (VB) technique. Crystals have been grown with 5 and 12 at% silicon at two different velocities, 0.75 and 2mm/h. Compositional mapping of crystals has been performed by energy dispersive X-ray spectroscopy (EDS). Then, effects of a submerged baffle on the longitudinal and radial solute distribution and interface stability have been discussed.
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