Abstract
Pure and tellurium-doped ZnO nanostructure films were prepared on microscopic glass substrates using the sol-gel method and investigated the relationship between the structural, morphological, roughness, and optical properties. The X-ray diffraction (XRD) spectra revealed that the nanostructure films have a hexagonal Wurtzite structure. The field emission scanning electron microscope (FESEM) images showed that the surface morphology of the nanostructure films was modified due to the Te dopant. The atomic force microscopy (AFM) technique was used to study the surface roughness of the pure ZnO and Te-doped ZnO deposited films. The optical properties of the nanostructure films were obtained using the ultraviolet-visible spectrophotometer. The effects of Te dopant elements on the optical characteristics and the samples’ energy band gaps were calculated and discussed.
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