Abstract

Due to their hilarious properties, carbon nanotubes (CNTs) with their different varieties have been suggested as potential alternatives for interconnects in many industrial applications related to Artificial Intelligence. This work made an overview of the various models of the resistive effect inside several CNT based interconnects. In addition, it has studied the propagation delay inside the CNT interconnect varieties by comparing two validated transient analysis methods, namely the FDTD and the ABCD matrix. The work has concluded the superiority of the ABCD-matrix method since it has given a better performance.

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