Abstract
To evaluate the efficiency of modified epoxy resins using bisphenol-A, hydantoin & cyanuric acid & to investigate the structural change due to the presence of Nitrogen atoms in polymeric chain for improved insulating properties, weatherability etc. The samples of epoxy resin bisphenol-a, hydantoin and Cyanuric acid based was taken for X-RAY diffraction analysis. The diffraction patterns were Fourier analysed to get an exact idea about the change in the polymer structure. From X-RAY diffraction analysis it was found that all physical parameters like area of cross section, number of carbon atoms per entanglement, stiffness parameter, particle size, percentage crystallinity & electron density fluctuation, in case of bisphenol-A based epoxy resin is more than other epoxy resins; that is; as the number of nitrogen atoms increased, all the physical parameters were reducedIn the present study only X-ray diffraction patterns of bisphenol-A, hydantoin and cyanuric acid based epoxy resins were studied. However their dielectric and ultrasonic properties could also be studied to get more information about the structur With the help of X-RAY diffraction patterns, one can easily check the synthesized samples of epoxy resins. The method to investigate the structural analysis of epoxy resin was novel and could find numerous applications in surfacecoatings.
Highlights
IntroductionPolymers are usually amorphous in nature and it is difficult to interpret their detailed structure by methods like U.V. and I.R. spectroscopy
Polymers are usually amorphous in nature and it is difficult to interpret their detailed structure by methods like U.V. and I.R. spectroscopy.X-ray Diffraction has been successfully used in the study of various structural aspects of amorphous polymers [1], as carried out in the present research paper
From X-ray diffraction analysis it was found that all physical parameters like area of cross section, number of carbon atoms per entanglement, stiffness parameter, particle size, percentage crystallinity & electron density fluctuation, in case of bisphenol-A based epoxy resin is more than other epoxy resins; that is; as the number of nitrogen atoms increased, all the physical parameters were reduced
Summary
Polymers are usually amorphous in nature and it is difficult to interpret their detailed structure by methods like U.V. and I.R. spectroscopy. X-ray Diffraction has been successfully used in the study of various structural aspects of amorphous polymers [1], as carried out in the present research paper. Using XRD, the curing kinetics of epoxy resin was studied by Wei-Bing et al [3]. Epoxy resins are compounds which contain the molecule more than one 1,2epoxy group capable of undergoing polyreaction referred to as curing reactions [4]. Epoxy resins derived from heterocyclic compounds have played a significant role showing good high temperature performance, outdoor WEATHERABILITY and insulating properties. A successful interpretation on X-ray DIFFRACTION studies regarding the structure of different resins was published earlier [5,6]. It was decided to take the X-ray DIFFRACTION patterns of bisphenol-A, hydantoin and cyanuric acid based epoxy resins for their more detailed structural investigations. The fourth section presents the results and discussions, and the fifth section gives the conclusion made from the above study
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