Abstract

The Shewhart X control chart is a useful process monitoring tool in manufacturing industries to detect the presence of assignable causes. However, it is insensitive in detecting small process shifts. To circumvent this problem, adaptive control charts are suggested. An adaptive chart enables at least one of the chart's parameters to be adjusted to increase the chart's sensitivity. Two common adaptive charts that exist in the literature are the double sampling (DS) X and variable sampling interval (VSI) X charts. This paper compares the performances of the DS X and VSI X charts, based on the average time to signal (ATS) criterion. The ATS profiles of the DS X and VSI X charts are obtained using the Mathematica and Statistical Analysis System (SAS) programs, respectively. The results show that the VSI X chart is generally superior to the DS X chart.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.