Abstract
The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
