Abstract
Development of a compact beam intensity monitor using gas amplified sample current measurement is described. The monitor can be a powerful tool for x-ray spectroscopy and microscopy when the beam is defined by a small pinhole or slits and when the workspace around the sample is limited. The thickness of the monitor is as small as approximately 3 mm, and the dimension is 10 mm square. The photon flux is monitored by measuring x-ray excited current from an Al foil under atmospheric conditions. Emitted electrons from the Al foil can ionize surrounding air molecules, and the gas amplified current can be measured with the use of a biased grid that prevents created ion pairs from recombination.
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