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Abstract
A compact soft X-ray pulse height analyzer (PHA) to obtain spatial profile of electron temperature has been developed in the HT-7 superconducting tokamak. This diagnostic system was combined with recently introduced Silicon Drift Detector (SDD). SDD allow the measurement of X-rays at high-count rates and cooled only by a single-stage peltier element. The profiles of electron temperature with spatial resolution of 4.8 cm can be well derived in the pure ohmic heated and auxiliary heated discharge. The performance and first experimental results from the PHA system are presented.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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