A compact model of transconductance and drain conductance for DMG-GC-DOT cylindrical gate MOSFET

Abstract

A compact model for dual-material gate graded-channel and dual-oxide<br />thickness with two dielectric constant different cylindrical gate (DMG-GC-<br />DOTTDCD) MOSFET was investigated in terms of transconductance, drain<br />conductance and capacitance. Short channel effects are modeled with simple<br />expressions, and incorporated into the core of the model (at the drain<br />current). The design effectiveness of DMG-GC-DOTTDCD was monitored<br />in comparing with the DMG-GC-DOT transistor, the effect of variations of<br />technology parameters, was presented in terms of gate polarization and drain<br />polarization. The results indicate that the DMG-GC-DOTTDCD devices<br />have characteristics higher than the DMG-GC-DOT MOSFET. To validate<br />the proposed model, we used the results obtained from the simulation of the<br />device with the SILVACO-ATLAS-TCAD software.