A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider

Abstract

Due to the lack of a standard nanosecond high-voltage pulse generator for sensor calibration, a high-stability nanosecond high-voltage pulse test system was developed in terms of circuit analysis, structural design, and performance test. By establishing the equivalent circuit model of the nanosecond pulse generator, the circuit component parameters of the five-stage Marx loop and the one-stage compression steepening unit were simulated. The influence of the action performance of the steepening gap on the characteristics of output nanosecond pulse was analyzed. The nanosecond pulse test system was established through the structural design of the nanosecond pulse-generating circuit, the development of a high-performance corona-stabilized switch, and the measurement of a fast-response resistance divider made of metal oxide thin-film resistors. The nanosecond pulse test system has the capability to output a double exponential nanosecond pulse voltages in the amplitude range of 10–60 kV with a rise time of 2.3 ± 0.5 ns and a half-peak time of 23 ± 5 ns. In addition, the output pulse voltage has a high consistency and stability in the full amplitude range. The maximum relative standard deviation of the peak value is 1.517%, and the relative standard uncertainty is less than 5‰.