Abstract
We develop a compact, high signal-to-noise ratio line-detector array Compton scatter imaging system based on Y2SiO5 scintillators and silicon photomultipliers. It is shown that the system's response uniformity is better than 98% for low-Zeff materials after a specific correction. Backscatter images of an “IHEP”-character model, cubes of different materials, and some other applications are presented, to show its potential for use in nondestructive testing.
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