A Common Knowledge-Driven Generic Vision Inspection Framework for Adaptation to Multiple Scenarios, Tasks, and Objects.

Abstract

The industrial manufacturing model is undergoing a transformation from a product-centric model to a customer-centric one. Driven by customized requirements, the complexity of products and the requirements for quality have increased, which pose a challenge to the applicability of traditional machine vision technology. Extensive research demonstrates the effectiveness of AI-based learning and image processing on specific objects or tasks, but few publications focus on the composite task of the integrated product, the traceability and improvability of methods, as well as the extraction and communication of knowledge between different scenarios or tasks. To address this problem, this paper proposes a common, knowledge-driven, generic vision inspection framework, targeted for standardizing product inspection into a process of information decoupling and adaptive metrics. Task-related object perception is planned into a multi-granularity and multi-pattern progressive alignment based on industry knowledge and structured tasks. Inspection is abstracted as a reconfigurable process of multi-sub-pattern space combination mapping and difference metric under appropriate high-level strategies and experiences. Finally, strategies for knowledge improvement and accumulation based on historical data are presented. The experiment demonstrates the process of generating a detection pipeline for complex products and continuously improving it through failure tracing and knowledge improvement. Compared to the (1.767°, 69.802 mm) and 0.883 obtained by state-of-the-art deep learning methods, the generated pipeline achieves a pose estimation ranging from (2.771°, 153.584 mm) to (1.034°, 52.308 mm) and a detection rate ranging from 0.462 to 0.927. Through verification of other imaging methods and industrial tasks, we prove that the key to adaptability lies in the mining of inherent commonalities of knowledge, multi-dimensional accumulation, and reapplication.