Abstract
Mechanisms of erosive wear are being studied using transmission electron microscopy (TEM) to examine the subsurface dislocation structures developed and scanning electron microscopy (SEM) to observe the surface topography. Specimens of recrystallized Ni 200 and copper single crystals have been eroded with 5 to 25μm glass microbeads and with 40 and 150 μm A12O3 particles at 53 m/sec using a slinger type erosion apparatus. Thin foils parallel to the original rough eroded surface and one μm or more below it have been prepared by first electroplating a few microns of nickel on the specimen and then electropolishing it away. Thin foil sections at 45̊ to the original surface have been prepared by sectioning specimens with thick electroplated layers; these allow observations to be made at different depths in the same foil.Material removal during particle impingement erosion at low angles of incidence probably occurs by a cutting or micromachining mechanism similar to that suggested by Finnie (1).
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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