Abstract
This letter presents a modeling method of lumped elements by using the Haar-wavelet MRTD (multiresolution time-domain) technique. With the MRTD technique, the conventional FDTD method is partly used to describe the localized characteristics of the lumped elements, which improves the analysis accuracy of the circuits with lumped elements. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 190–192, 2000.
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