Abstract
In electron optical instrumentation, it would be generally desirable to have a lens with a short focal length. Both spherical and chromatical aberration decreases with focal length and this will result in a better resolution and image brightness. This consideration has been taken into account in the design of conventional electron microscopes, and the focal length of the objective lens of such instrumentation ranges from a few millimeters to a fraction of a millimeter. A short focal length lens requires that the specimen be located in a magnetic field i.e., within the pole piece gap. This results in (a) a limitation in the size of the specimen and (b) a restriction, to use the microscope to nonmagnetic specimens only.
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