A closed-form solution to time-dependent reliability of aging structures described by gamma-based deterioration models

Abstract

Structural resistance deterioration is by nature a non-increasing stochastic process with autocorrelation on the temporal scale. The Gamma process is often used to describe the stochastic behavior of resistance deterioration. With Gamma-based deterioration models, the calculation of time-dependent reliability presents a serious challenge, and often Monte Carlo simulation is the only solution to this problem. This paper derives a closed-form solution for time-dependent reliability of aging structures, in which the resistance deterioration is described by a Gamma process and the applied load is modelled as a Gaussian process with a constant standard deviation. The accuracy of the proposed method is verified through a comparison with Monte Carlo simulation results, and its applicability is further illustrated in a time-dependent reliability analysis of an existing highway bridge whose vehicle load is modelled using weigh-in-motion (WIM) data. It is found that the measured vehicle load has a relatively small uncertainty, and the uncertainty associated with resistance deterioration is crucial to the reliability assessment because it dominates the overall uncertainty in the reliability calculation.