Abstract
Ion extraction systems in two dimensions are analyzed by using the boundary element method (BEM). Since it is impossible to know a priori the shape of the ion emitting surface, this problem must be treated as an inverse problem. In this analysis, the ion emitting surface, motion of ions and the electric field are self-consistently calculated using the iterative method. Namely, the ion emitting surface is modified in each iterative step to make current density on the ion emitting surface satisfy the Child-Langmuir law. BEM is applied to accurately and continuosly calculate the electric forces on ions at arbitrary points in the extraction system. As a result, it is shown that the deflection angle of the ion beam has a minimum value at a certain extraction voltage.
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