A Bayesian approach for correcting for partial plating in fluctuation experiments

Abstract

The fluctuation experiment is the preferred method for estimating microbial mutation rates. A difficult task facing the data analyst is to infer the mean number of mutations from the number of mutant cells that only indirectly reflects the number of mutations. Partial plating, commonly practised in the laboratory, renders this task even more challenging by allowing only a portion of the mutant cells to be counted. In this paper, we propose a Bayesian approach to correcting for partial plating in the analysis of fluctuation experiments.