A Bayesian Analysis for Accelerated Lifetime Tests Under an Exponential Power Law Model with Threshold Stress

Abstract

In this paper, we present a Bayesian methodology for modelling accelerated lifetime tests under a stress response relationship with a threshold stress. Both Laplace and MCMC methods are considered. The methodology is described in detail for the case when an exponential distribution is assumed to express the behaviour of lifetimes, and a power law model with a threshold stress is assumed as the stress response relationship. We assume vague but proper priors for the parameters of interest. The methodology is illustrated by a accelerated failure test on an electrical insulation film.