Abstract

This paper presents a background noninvasive true calibration technique to correct for nonidealities in pipelined analog-to-digital converters (ADCs). Pipelined ADC suffers from finite nonlinear gain in amplifiers, ratio mismatch in capacitors, and errors in voltage references. Most calibration schemes do not account for reference voltage errors or nonlinearity in amplifiers, which introduce severe distortion in pipelined ADCs designed in a deep-submicron and nanometer-scale digital CMOS process. The proposed digital calibration scheme uses an insignificant, low-speed, low-power, high-resolution sigma-delta ADC to estimate a set of digital error-correction parameters in background using an adaptive LMS algorithm. The technique is shown to correct all static errors within a single framework - finite amplifier gain, capacitor ratio mismatch, voltage reference errors and amplifier nonlinearity. The scheme is demonstrated for a 14-bit A/D converter intended for speeds higher than 100Msample/s.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.