Abstract
A highly digital two-stage fractional- $N$ phase-locked loop (PLL) architecture utilizing a first-order 1-bit $ \Delta \!\Sigma $ frequency-to-digital converter (FDC) is proposed and implemented in a 65nm CMOS process. Performance of the first-order 1-bit $ \Delta \!\Sigma $ FDC is improved by using a phase interpolator-based fractional divider that reduces phase quantizer input span and by using a multiplying delay-locked loop that increases its oversampling ratio. We also describe an analogy between a time-to-digital converter (TDC) and a $ \Delta \!\Sigma $ FDC followed by an accumulator that allows us to leverage the TDC-based PLL analysis techniques to study the impact of $ \Delta \!\Sigma $ FDC characteristics on $ \Delta \!\Sigma $ FDC-based fractional- $N$ PLL (FDCPLL) performance. Utilizing proposed techniques, a prototype PLL achieves 1 MHz bandwidth, −101.6 dBc/Hz in-band phase noise, and $ {\textrm {1.22 ps}_{\textrm {rms}}}$ (1 kHz–40 MHz) jitter while generating 5.031GHz output from 31.25MHz reference clock input. For the same output frequency, the stand-alone second-stage fractional- $N$ FDCPLL achieves 1MHz bandwidth, −106.1dBc/Hz in-band phase noise, and $ {\textrm {403 fs}_{\textrm {rms}}}$ jitter with a 500MHz reference clock input. The two-stage PLL consumes 10.1mW power from a 1V supply, out of which 7.1 mW is consumed by the second-stage FDCPLL.
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