A 4.2 ps Time-Interval RMS Resolution Time-to-Digital Converter Using a Bin Decimation Method in an UltraScale FPGA

Abstract

The common solution for a field programmable gate array (FPGA)-based time-to-digital converter (TDC) is constructing a tapped delay line (TDL) for time interpolation to yield a sub-clock time resolution. The granularity and uniformity of the delay elements of TDL determine the TDC time resolution. In this paper, we propose a dual-sampling TDL architecture and a bin decimation method that could make the delay elements as small and uniform as possible, so that the implemented TDCs can achieve a high time resolution beyond the intrinsic cell delay. Two identical full hardware-based TDCs were implemented in a Xilinx UltraScale FPGA for performance evaluation. For fixed time intervals in the range from 0 to 440 ns, the average time-interval RMS resolution is measured by the two TDCs with 4.2 ps, thus the timestamp resolution of single TDC is derived as 2.97 ps. The maximum hit rate of the TDC is as high as half the system clock rate of FPGA, namely 250 MHz in our demo prototype. Because the conventional online bin-by-bin calibration is not needed, the implementation of the proposed TDC is straightforward and relatively resource-saving.