Abstract
We propose a configuration of a phased-array receiver with an on-chip built-in self-test (BIST) function. Detection errors caused by asymmetry of the passive circuit are eliminated using a symmetrical layout signal distributor in the BIST path. By composing the signal distributor in compact manner with a shielded circuit structure, the adverse effect on the main receiving circuit is suppressed. We tested a 28-GHz CMOS phased-array receiver chip. Using this chip's receiver BIST function, we demonstrated that the difference in characteristics of phase between array elements in a phased-array receiver can be ascertained.
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