Abstract

In this article, a slot array with double-layered full-corporate-fed distribution network by ridge gap waveguide (RGW) in the G-band is presented. The array antenna proposed in this article contains $16\times 16$ -element radiation slots fed by air-filled ridge gap waveguide distribution network that achieves high-efficiency. Gap waveguide technology avoids the demand for perfect electrical contact in millimeter waves, therefore the expensive diffusion bonding and the laser welding processes are not demanded. Moreover, the high-accurate Computerized Numerical Control (CNC) machining is applied for the fabrication. Due to the limited layout space for the distribution network, two types of universal stepped cavity power dividers are presented in this article. The proposed array antenna is fed by a standard WR-5 waveguide at the bottom. Furthermore, the tested outcomes show that the proposed $16\times 16$ -element array has a gain larger than 30 dBi with over 50% antenna efficiency in the frequency range of 155–171 GHz.

Highlights

  • G-band (140-220 GHz) has been drawn considerable attention for imaging, sensing, and communication due to its short wavelength and wide available bandwidth [1]–[4]

  • We propose a ridge gap waveguide (RGW)-based corporate-fed planar slot array at 160 GHz to fill the gap

  • RGW lines, separated by one row of metallic pins, and the corresponding mutual coupling is below −20 dB from 152 to 175 GHz, which is a promising result at such high frequency

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Summary

INTRODUCTION

G-band (140-220 GHz) has been drawn considerable attention for imaging, sensing, and communication due to its short wavelength and wide available bandwidth [1]–[4]. RGW lines, separated by one row of metallic pins, and the corresponding mutual coupling is below −20 dB from 152 to 175 GHz, which is a promising result at such high frequency. The difference between the simulated and measured gain results of the antenna’s radiation pattern may be due to the additional reflection losses and extra ohmic losses caused by the reduced metal conductivity with surface roughness

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