A 12-bit single slope ADC with multi-step structure and ramp calibration technique for image sensors

Abstract

This paper presents a novel multi-step single slope analog to digital converter (MS SS ADC). The proposed ADC splits the 12-bit conversion into 3 steps, including 1-bit half section decision, 4-bit coarse conversion, and finally 8-bit fine conversion with 1-bit redundancy. The conversion step is substantially reduced from conventional 4096 to 276. The linearity of the ADC is guaranteed by a stable common mode voltage of the comparator varying only within 31.25 mV. Moreover, two high-accuracy ramp calibration techniques are utilized to correct the current variation in the fine ramp and the slope error between the coarse and fine ramps. A hybrid comparator is utilized in the ADC to save power while maintaining the performance. The ADC is designed and simulated in 0.18 μm CMOS process with 7.5 μm width. The differential nonlinearity and integral nonlinearity of the proposed ADC are reduced from +0.3/-1 LSB and +3.1/-2.55 LSB to +0.3/-0.3 LSB and +1/-0.45 LSB at 61.7 kS/s sample rate by the calibrations.