A 10-bit 100-MS/s Dual-Channel Pipelined ADC Using Dynamic Memory Effect Cancellation Technique

Abstract

This brief presents a 10-bit 100-MS/s 1.2-V dual-channel pipelined CMOS analog-to-digital converter (ADC). The nine dual-channel pipelined stages share the operational amplifiers (op-amps) to optimize power and area. The proposed dynamic memory effect cancellation technique reduces the cross coupling caused by the residual charge in the op-amp sharing topology. The op-amp gain requirement of the dual-channel sample-and-hold circuit is also relaxed by the proposed memory effect cancellation technique. The prototype ADC achieves a peak signal-to-noise and distortion ratio of 56 dB for a 1-MHz input signal and a peak cross-coupling ratio of 67.4 dB at 100 MS/s while consuming 16.2 mW/channel from a 1.2-V supply. The prototype ADC occupies 1.96 mm2 using a 0.13-μm CMOS technology.